Temperature Dependence of Minority Carrier Lifetime in Epitaxially Grown p+-p-n+ 4H-SiC Drift Step Recovery Diodes

Publisher: Trans Tech Publications

E-ISSN: 1662-9752|2015|821|632-635

ISSN: 0255-5476

Source: Materials Science Forum, Vol.2015, Iss.821, 2015-07, pp. : 632-635

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Abstract