Tailored multivariate analysis for modulated enhanced diffraction

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|6|1679-1691

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 1679-1691

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Abstract