Improvement of interfacial and electrical properties of Al2O3/ n-Ga0.47In0.53As for III-V impact ionization MOSFETs

Publisher: IOP Publishing

E-ISSN: 1742-6596|647|1|255-258

ISSN: 1742-6596

Source: Journal of Physics: Conference Series , Vol.647, Iss.1, 2015-10, pp. : 255-258

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Abstract