![Open access](/images/ico/o.png)
![](/images/ico/ico5.png)
Publisher: IOP Publishing
E-ISSN: 1742-6596|690|1|145-149
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.690, Iss.1, 2016-02, pp. : 145-149
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
![](/images/ico/o.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/o.png)
![](/images/ico/ico5.png)
Electrical Characterization of Microelectromechanical Silicon Carbide Resonators
By Chang Wen-Teng Zorman Christian
Sensors, Vol. 8, Iss. 9, 2008-09 ,pp. :