Functional Testing and Characterisation of ISFETs on Wafer Level by Means of a Micro-droplet Cell#

Author: Poghossian Arshak   Schumacher Kerstin   Kloock Joachim P.   Rosenkranz Christian   Schultze Joachim W.   Müller-Veggian Mattea   Schöning Michael J.  

Publisher: MDPI

E-ISSN: 1424-8220|6|4|397-404

ISSN: 1424-8220

Source: Sensors, Vol.6, Iss.4, 2006-04, pp. : 397-404

Access to resources Favorite

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract