Reliability assessment of MEMS switches for space applications: laboratory and launch testing

E-ISSN： 1361-6439|24|12|125009-125018

ISSN： 0960-1317

Source： Journal of Micromechanics and Microengineering, Vol.24, Iss.12, 2014-12, pp. : 125009-125018

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Research Reviews and Prospects of MEMS Reliability

By Hu Yi Shen Xuejin Zhang Yongyu Wang Zhenlu Chen Xiaoyang

Integrated Ferroelectrics, Vol. 152, Iss. 1, 2014-03 ,pp. : 8-21

Taylor & Francis Ltd

Access to resources Recommend Favorite

Principle and applications of MEMS: a review

By Mahalik N.P.

International Journal of Manufacturing Technology and Management, Vol. 13, Iss. 2-3, 2008-01 ,pp. : 324-343

Inderscience Publishers

Access to resources Recommend Favorite

A review of micro-contact physics for microelectromechanical systems (MEMS) metal contact switches

By Toler Benjamin F Coutu Ronald A McBride John W

Journal of Micromechanics and Microengineering, Vol. 23, Iss. 10, 2013-10 ,pp. : 103001-103016

IOP Publishing

Access to resources Recommend Favorite

Clear evidence of mechanical deformation in RF-MEMS switches during prolonged actuation

By Mulloni V Resta G Margesin B

Journal of Micromechanics and Microengineering, Vol. 24, Iss. 7, 2014-07 ,pp. : 75003-75011

IOP Publishing

Access to resources Recommend Favorite

Laterally-actuated inside-driven RF MEMS switches fabricated by a SOG process

By Wang Li-Feng Han Lei Tang Jie-Ying Huang Qing-An

Journal of Micromechanics and Microengineering, Vol. 25, Iss. 6, 2015-06 ,pp. : 65007-65016

IOP Publishing

Access to resources Recommend Favorite