Reconstruction of height of sub-nanometer steps with bimodal atomic force microscopy

Author： Lai Chia-Yun   Santos Sergio   Chiesa Matteo  

Publisher： IOP Publishing

E-ISSN： 1361-6528|27|7|75701-75706

ISSN： 0957-4484

Source： Nanotechnology, Vol.27, Iss.7, 2016-02, pp. : 75701-75706

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