Simulation and comparison of MOS inversion layer quantum mechanics effects in SiGe PMOSFET and Si PMOSFET

Author: Rong Y.   Jinsheng L.   Jing T.   Ruizhi Z.  

Publisher: Elsevier

ISSN: 0026-2692

Source: Microelectronics, Vol.35, Iss.2, 2004-02, pp. : 145-149

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