

Author: Siemieniec R. Lutz J.
Publisher: Elsevier
ISSN: 0026-2692
Source: Microelectronics, Vol.35, Iss.3, 2004-03, pp. : 259-267
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content






By Fujioka A Asada K Yamada H Ohtsuka T Ogawa T Kosugi T Kishikawa D Mukai T
Semiconductor Science and Technology, Vol. 29, Iss. 8, 2014-06 ,pp. :




Advanced Local Lifetime Control for Higher Reliability of Power Devices
Microelectronics Reliability, Vol. 43, Iss. 9, 2003-09 ,pp. :