Integrated vapor pressure, hygroswelling, and thermo-mechanical stress modeling of QFN package during reflow with interfacial fracture mechanics analysis

Author: Tee T.Y.   Zhong Z.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.44, Iss.1, 2004-01, pp. : 105-114

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