The effect of model building on the accuracy of fatigue life predictions in electronic packages

Author： Towashiraporn P. Subbarayan G. McIlvanie B. Hunter B.C. Love D. Sullivan B.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.44, Iss.1, 2004-01, pp. : 115-127

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