Electrical overstress in AlGaN/GaN HEMTs: study of degradation processes

Author： Kuzmik J.   Pogany D.   Gornik E.   Javorka P.   Kordos P.  

Publisher： Elsevier

ISSN： 0038-1101

Source： Solid-State Electronics, Vol.48, Iss.2, 2004-02, pp. : 271-276

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