Transmission electron microscopy study of stacking-fault trapezoids and stacking-fault tubes in ZnSe/GaAs(001) pseudomorphic epitaxial layers

By N.Wang   Sou I. K.   Fung K. K.  

Philosophical Magazine Letters, Vol. 76, Iss. 3, 1997-09 ,pp. : 153-158

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Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

By Metzger T.   Hopler R.   Born E.   Ambacher O.   Stutzmann M.   Stommer R.   Schuster M.   Gobel H.   Christiansen S.   Albrecht M.   Strunk H. P.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 77, Iss. 4, 1998-04 ,pp. : 1013-1025

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On the measurement of dislocation core distributions in a GaAs/ZnTe/CdTe heterostructure by high-resolution transmission electron microscopy

By Kret Sławomir   Dłużewski Paweł   Dłużewski Piotr   Laval Jean-Yves  

Philosophical Magazine, Vol. 83, Iss. 2, 2003-01 ,pp. : 231-244

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High-resolution transmission electron microscopy study of epitaxial passive films on nanocubes of chromium

By J. C. Rao   X. X. Zhang   B. Qin   K. K. Fung  

Philosophical Magazine Letters, Vol. 83, Iss. 6, 2003-06 ,pp. : 395-401

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Transmission electron microscopy study of epitaxial lanthanum-manganite thin films on SrTiO3

By Han K.   Yu-Zhang K.  

Philosophical Magazine B, Vol. 79, Iss. 6, 1999-06 ,pp. : 897-909

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