Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

By Wohl G.   Schollhorn C.   Schmidt O.G.   Brunner K.   Eberl K.   Kienzle O.   Ernst F.  

Thin Solid Films, Vol. 321, Iss. 1, 1998-05 ,pp. : 86-91

Elsevier

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Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

By Lagerpusch Ulrike   Anczykowski Boris   Nembach Eckhard  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 81, Iss. 11, 2001-11 ,pp. : 2613-2628

Taylor & Francis Ltd

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In-situ atomic force microscopy and transmission electron microscopy observations of the deformation of MC2 nickel-based superalloy gamma phase

By Coupeau C.   Brochard S.   Jouiad M.   Coujou A.   Grilhe J.  

Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties, Vol. 79, Iss. 3, 1999-03 ,pp. : 627-638

Taylor & Francis Ltd

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Effects of high dose Bi+ implantation on Si : An atomic force and transmission electron microscopy study

By Angelov C.   Faure J.   Kalitzova M.   Simov S.   Tzvetkova T.   Djakov A.  

Vacuum, Vol. 51, Iss. 2, 1998-10 ,pp. : 285-288

Elsevier

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Electron microscopy of dislocations introduced into GaN by plastic deformation

By Suzuki K.   Takeuchi S.  

Philosophical Magazine Letters, Vol. 79, Iss. 7, 1999-07 ,pp. : 423-428

Taylor & Francis Ltd

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