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Elsevier

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Characterization of self-assembled Ge islands on Si(100) by atomic force microscopy and transmission electron microscopy

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Characterization of room-temperature plastic deformation of -Si 3 N 4 by atomic force microscopy and transmission electron microscopy

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Comparison of atomic force microscopy and transmission electron microscopy of second-phase particles

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Atomic structure and core composition of partial dislocations and dislocation fronts in β-SiC by high-resolution transmission electron microscopy

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