Chemical bonds and microstructure in nearly stoichiometric PECVD aSi x N y H z

Author: Savall C.   Bruyere J.C.   Stoquert J.P.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.260, Iss.2, 1995-05, pp. : 174-180

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Abstract