Thick SiO x N y and SiO 2 films obtained by PECVD technique at low temperatures

Author: Alayo M.I.   Pereyra I.   Carreno M.N.P.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.332, Iss.1, 1998-11, pp. : 40-45

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract