Quantitative study by atomic force microscopy and spectrophotometry of the roughness and brightness of electrodeposited nickel in the presence of additives

Author： Troyon M.   Darrort V.   Ebothe J.   Bissieux C.   Nicollin C.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.265, Iss.1, 1995-09, pp. : 52-57

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