Optical properties of SiC investigated by spectroscopic ellipsometry from 3.5 to 10 eV

By Cobet C.   Wilmers K.   Wethkamp T.   Edwards N.V.   Esser N.   Richter W.  

Thin Solid Films, Vol. 364, Iss. 1, 2000-03 ,pp. : 111-113

Elsevier

Access to resources Recommend Favorite

Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV

By Franke E.   Schubert M.   Trimble C.L.   DeVries M.J.   Woollam J.A.  

Thin Solid Films, Vol. 388, Iss. 1, 2001-06 ,pp. : 283-289

Elsevier

Access to resources Recommend Favorite

Optical properties of nanophase films measured by variable-angle spectroscopic ellipsometry

By Urban F.K.   Hosseini-Tehrani A.   Khabari A.   Griffiths P.   Bungay C.   Petrov I.   Kim Y.  

Thin Solid Films, Vol. 408, Iss. 1, 2002-04 ,pp. : 211-217

Elsevier

Access to resources Recommend Favorite

The optical and structural properties of AlN thin films characterized by spectroscopic ellipsometry

By Joo H.Y.   Kim H.J.   Kim S.J.   Kim S.Y.  

Thin Solid Films, Vol. 368, Iss. 1, 2000-06 ,pp. : 67-73

Elsevier

Access to resources Recommend Favorite

Retrieving aerosol optical depth using visible and mid-IR channels from geostationary satellite MTSAT-1R

By Kim J.   Yoon J. -M.   Ahn M. H.   Sohn B. J.   Lim H. S.  

International Journal of Remote Sensing, Vol. 29, Iss. 21, 2008-11 ,pp. : 6181-6192

Taylor & Francis Ltd

Access to resources Recommend Favorite