The effect of microwave power on the deposition of boron-doped a-SiC:H films using the electron cyclotron resonance method

Author: Yoon S.F.   Ji R.   Ahn J.   Milne W.I.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.288, Iss.1, 1996-11, pp. : 155-159

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Abstract