Grain sizes of Ni films measured by STM and X-ray methods

Author: Wang D.   Geyer U.   Schneider S.   Von Minnigerode G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.292, Iss.1, 1997-01, pp. : 184-188

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract