Author： Lignier O. Couturier G. Tedd J. Gonbeau D. Salardenne J.
Publisher： Elsevier
ISSN： 0040-6090
Source： Thin Solid Films, Vol.299, Iss.1, 1997-05, pp. : 45-52
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
Properties of sputtered thin films of vanadium-titanium oxide for use in electrochromic windows
By Burdis M.S.
Thin Solid Films, Vol. 311, Iss. 1, 1997-12 ,pp. :
Raman spectroscopy analysis of magnetron sputtered RuO 2 thin films
By Meng L.-j. Teixeira V. dos Santos M.P.
Thin Solid Films, Vol. 442, Iss. 1, 2003-10 ,pp. :
Conductivity of micro-porous magnetron-sputtered thin TiO 2 films
By Dimitrov D.B. Koprinarova J. Pazov J. Angelov C.
Vacuum, Vol. 58, Iss. 2, 2000-08 ,pp. :
Structural analysis of 2H-WS 2 thin films by X-ray and TEM investigation
By Ennaoui A. Diesner K. Fiechter S. Moser J.H. Levy F.
Thin Solid Films, Vol. 311, Iss. 1, 1997-12 ,pp. :