Microstructural changes of Pt/Ti bilayer during annealing in different atmospheres - An XRD study

Author: Ehrlich A.   Hoyer W.   Weisz U.   Geszner T.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.300, Iss.1, 1997-05, pp. : 122-130

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Abstract