In situ reflection high energy electron bombardment analysis of biaxially oriented yttria-stabilized zirconia thin film growth on amorphous substrates

Author： Betz V.   Holzapfel B.   Schultz L.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.301, Iss.1, 1997-06, pp. : 28-34

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