X-ray photoelectron spectroscopy, scanning electron microscopy and optical transmittance studies of indium tin oxide and cadmium sulphide thin films for solar cells

By Stoev M.D.   Touskova J.   Tousek J.  

Thin Solid Films, Vol. 299, Iss. 1, 1997-05 ,pp. : 67-71

Elsevier

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Reactively DC magnetron sputtered thin AlN films studied by X-ray photoelectron spectroscopy and polarised infrared reflection

By Manova D.   Dimitrova V.   Karpuzov D.   Yankov R.  

Vacuum, Vol. 52, Iss. 3, 1999-03 ,pp. : 301-305

Elsevier

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X-ray photoelectron spectroscopy and grazing incidence X-ray reflectivity study of silicon nitride thin films

By Li B.   Fujimoto T.   Fukumoto N.   Honda K.   Kojima I.  

Thin Solid Films, Vol. 334, Iss. 1, 1998-12 ,pp. : 140-144

Elsevier

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Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering

By Wong H.Y.   Ong C.W.   Kwok R.W.M.   Wong K.W.   Wong S.P.   Cheung W.Y.  

Thin Solid Films, Vol. 376, Iss. 1, 2000-11 ,pp. : 131-139

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Determination of the States of Oxidation of Metals in Thin Oxide Films by X-Ray Photoelectron Spectroscopy

By Alov N.  

Journal of Analytical Chemistry, Vol. 60, Iss. 5, 2005-05 ,pp. : 431-435

MAIK Nauka/Interperiodica

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