Characterization of indium-tin oxide films by means of ion-implanted nuclear probes

Author： Metzner H.   Habenicht S.   Hahn T.   Uhrmacher M.   Lieb K.-P.   Borchert D.   Job R.   Fahrner W.R.  

Publisher： Elsevier

ISSN： 0040-6090

Source： Thin Solid Films, Vol.317, Iss.1, 1998-04, pp. : 161-164

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