X-Ray diffraction studies of p-CdS:Cu thin films

By Kashiwaba Y.   Komatsu T.   Nishikawa M.   Ishikawa Y.   Segawa K.   Hayasi Y.  

Thin Solid Films, Vol. 408, Iss. 1, 2002-04 ,pp. : 43-50

Elsevier

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Profile analysis of thin film X-ray diffraction peaks

By Bimbault L.   Badawi K.F.   Goudeau P.   Durand N.   Branger V.  

Thin Solid Films, Vol. 275, Iss. 1, 1996-04 ,pp. : 40-43

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Structural analysis of Co-Cr alloy films by X-ray diffraction

By Zhou Z.-F.   Fan Y.-D.  

Thin Solid Films, Vol. 339, Iss. 1, 1999-02 ,pp. : 95-101

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X-ray profile analysis on dislocations and hardness of Copper films

By Shan F.L.   Wang Y.M.  

Vacuum, Vol. 51, Iss. 3, 1998-11 ,pp. : 381-383

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The use of in situ X-ray diffraction, optical scattering and resistance analysis techniques for evaluation of copper diffusion barriers in blanket films and damascene structures

By Cabral Jr. C.   Lavoie C.   Harper J.M.E.   Jordan-Sweet J.  

Thin Solid Films, Vol. 397, Iss. 1, 2001-10 ,pp. : 194-202

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