Preparation and characterization of Bi 2 S 3 -PbS thin films by X-ray diffraction, scanning electron microscopy and resistivity studies

By Acharya B.S.   Nayak B.B.   Parhi N.  

Thin Solid Films, Vol. 254, Iss. 1, 1995-01 ,pp. : 47-53

Elsevier

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X-ray photoelectron spectroscopy characterization of amorphous molybdenum oxysulfide thin films

By Benoist L.   Gonbeau D.   Pfister-Guillouzo G.   Schmidt E.   Meunier G.   Levasseur A.  

Thin Solid Films, Vol. 258, Iss. 1, 1995-03 ,pp. : 110-114

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Determination of residual stress in thin films: a comparative study of X-ray topography versus laser curvature method

By Zhao Z.B.   Hershberger J.   Yalisove S.M.   Bilello J.C.  

Thin Solid Films, Vol. 415, Iss. 1, 2002-08 ,pp. : 21-31

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Characterization of SiGeC thin films by MeV ion scattering and X-ray diffraction

By Nagaki M.   Narusawa T.   Hiraki A.   Saitoh T.   Kubo M.  

Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. : 143-147

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SnO 2 thin films prepared by ion beam induced CVD: preparation and characterization by X-ray absorption spectroscopy

By Jimenez V.M.   Espinos J.P.   Caballero A.   Contreras L.   Fernandez A.   Justo A.   Gonzalez-Elipe A.R.  

Thin Solid Films, Vol. 353, Iss. 1, 1999-09 ,pp. : 113-123

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