The influence of growth temperature on the period of RHEED oscillations during MBE of Si and Ge on Si(111) surface

Author: Nikiforov A.I.   Markov V.A.   Cherepanov V.A.   Pchelyakov O.P.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.336, Iss.1, 1998-12, pp. : 183-187

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Abstract