Changes in the microstructure of GaN layers on sapphire upon annealing at high pressure

Author: Domagala J.   Leszczynski M.   Suski T.   Jun J.   Prystawko P.   Teisseyre H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.350, Iss.1, 1999-08, pp. : 295-299

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