Ellipsometry and Raman study on hydrogenated amorphous carbon (a-C:H) films deposited in a dual ECR-r.f. plasma

Author: Hong J.   Goullet A.   Turban G.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.352, Iss.1, 1999-09, pp. : 41-48

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Abstract