Interplay of dislocation network and island arrangement in SiGe films grown on Si(001)

Author: Teichert C.   Hofer C.   Lyutovich K.   Bauer M.   Kasper E.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.380, Iss.1, 2000-12, pp. : 25-28

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Abstract