Analysis of bias stress on thin-film transistors obtained by Hot-Wire Chemical Vapour Deposition

Author: Dosev D.K.   Puigdollers J.   Orpella A.   Voz C.   Fonrodona M.   Soler D.   Marsal L.F.   Pallares J.   Bertomeu J.   Andreu J.   Alcubilla R.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.383, Iss.1, 2001-02, pp. : 307-309

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Abstract