Characterization of carburized tantalum layers prepared in inductive RF plasma

Author: Raveh A.   Danon A.   Hayon J.   Rubinshtein A.   Shneck R.   Klemberg-Sapieha J.E.   Martinu L.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.392, Iss.1, 2001-07, pp. : 56-64

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Abstract