A Cat-CVD Si 3 N 4 film study and its application to the ULSI process

Author: Uchiyama Y.   Masuda A.   Matsumura H.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.395, Iss.1, 2001-09, pp. : 275-279

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract