Stability and transport properties of microcrystalline Si 1-x Ge x films

By Edelman F.   Raz T.   Komem Y.   Stolzer M.   Werner P.   Zaumseil P.   Osten H.-J.   Griesche J.   Capitan M.  

Thin Solid Films, Vol. 337, Iss. 1, 1999-01 ,pp. : 152-157

Elsevier

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In situ characterization of thin Si 1-x Ge x films on Si(100) by spectroscopic ellipsometry

By Akazawa H.  

Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. : 157-160

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Strain and misfit dislocation density in finite lateral size Si 1-x Ge x films grown by selective epitaxy

By Hollander B.   Vescan L.   Mesters S.   Wickenhauser S.  

Thin Solid Films, Vol. 292, Iss. 1, 1997-01 ,pp. : 213-217

Elsevier

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Segregation and diffusion of impurities from doped Si 1-x Ge x films into silicon

By Kobayashi S.   Aoki T.   Mikoshiba N.   Sakuraba M.   Matsuura T.   Murota J.  

Thin Solid Films, Vol. 369, Iss. 1, 2000-07 ,pp. : 222-225

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Optical and electrical properties of Si 1-x-y Ge x C y thin films and devices

By St. Amour A.   Chang C.L.   Lanzerotti L.D.   Sturm J.C.  

Thin Solid Films, Vol. 294, Iss. 1, 1997-02 ,pp. : 112-117

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