Author： Campestrini P. Bohm S. Schram T. Terryn H. de Wit J.H.W.
Publisher： Elsevier
ISSN： 0040-6090
Source： Thin Solid Films, Vol.410, Iss.1, 2002-05, pp. : 76-85
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Electrochemical study of the corrosion behavior of Ce sealing of anodized 2024 aluminum alloy
Thin Solid Films, Vol. 423, Iss. 2, 2003-01 ,pp. :
Access to resources
Recommend
Spectroscopic ellipsometry of multilayer dielectric coatings
By Bhattacharyya D. Sahoo N.K. Thakur S. Das N.C.
Vacuum, Vol. 60, Iss. 4, 2001-03 ,pp. :
Optical study of ion-deposited diamond-like carbon films using spectroscopic ellipsometry
By Mori T. Fujii N. Xiong Y.-M. Saitoh T.
Thin Solid Films, Vol. 270, Iss. 1, 1995-12 ,pp. :
By Petrik P. Biro L.P. Fried M. Lohner T. Berger R. Schneider C. Gyulai J. Ryssel H.
Thin Solid Films, Vol. 315, Iss. 1, 1998-03 ,pp. :