Author: Gracin D. Dubcek P. Jaksic M. Bernstorff S.
Publisher: Elsevier
ISSN: 0040-6090
Source: Thin Solid Films, Vol.433, Iss.1, 2003-06, pp. : 88-91
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Properties of amorphous silicon carbide films prepared by PECVD
By Huran J. Hrubcin L. Kobzev A.P. Liday J.
Vacuum, Vol. 47, Iss. 10, 1996-10 ,pp. :
RBS and optical studies of ion-implanted amorphous silicon carbide layers
By Romanek J. Kobzev A.P. Kulik M. Tsvetkova T. Zuk J.
Vacuum, Vol. 70, Iss. 2, 2003-03 ,pp. :
Optical gap and photoluminescence properties of amorphous silicon alloys
Philosophical Magazine B, Vol. 80, Iss. 4, 2000-04 ,pp. :