Author： Wang J.Y. Zalar A. Zhao Y.H. Mittemeijer E.J.
Publisher： Elsevier
ISSN： 0040-6090
Source： Thin Solid Films, Vol.433, Iss.1, 2003-06, pp. : 92-96
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Quantitative Auger electron spectroscopy in thin film depth profiling
By Hofmann S.
Vacuum, Vol. 48, Iss. 7, 1997-09 ,pp. :
Access to resources
Recommend
Interdiffusion in compositionally modulated amorphous Nb/Si multilayers
By Zhang M. Yu W. Wang W.H. Wang W.K.
Thin Solid Films, Vol. 287, Iss. 1, 1996-10 ,pp. :
AES depth profiling of thermally treated Al/Si thin-film structures
By Zalar A. Wang J.Y. Zhao Y.H. Mittemeijer E.J. Panjan P.
Vacuum, Vol. 71, Iss. 1, 2003-05 ,pp. :
By Laidani N. Dorigoni C. Miotello A. Calliari L. Scarel G. Sancrotti M.
Thin Solid Films, Vol. 317, Iss. 1, 1998-04 ,pp. :