Boron diffusion into nitrogen doped silicon films for P + polysilicon gate structures

Author: Mansour F.   Mahamdi R.   Jalabert L.   Temple-Boyer P.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.434, Iss.1, 2003-06, pp. : 152-156

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Abstract