Characterization of different porous silicon structures by spectroscopic ellipsometry

By Fried M.   Lohner T.   Polgar O.   Petrik P.   Vazsonyi E.   Barsony I.   Piel J.P.   Stehle J.L.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 223-227

Elsevier

Access to resources Recommend Favorite

Influence of the formation conditions on the microstructure of porous silicon layers studied by spectroscopic ellipsometry

By Rossow U.   Frotscher U.   Thonissen M.   Berger M.G.   Frohnhoff S.   Munder H.   Richter W.  

Thin Solid Films, Vol. 255, Iss. 1, 1995-01 ,pp. : 5-8

Elsevier

Access to resources Recommend Favorite

Air pockets in thin porous platinum films studied by spectroscopic ellipsometry

By Arwin H.   Guo S.   Hedborg E.   Lundstrom I.  

Thin Solid Films, Vol. 293, Iss. 1, 1997-01 ,pp. : 179-184

Elsevier

Access to resources Recommend Favorite

Investigation of different oxidation processes for porous silicon studied by spectroscopic ellipsometry

By Frotscher U.   Rossow U.   Ebert M.   Pietryga C.   Richter W.   Munder H.   Arens-Fischer R.   Berger M.G.  

Thin Solid Films, Vol. 276, Iss. 1, 1996-04 ,pp. : 36-39

Elsevier

Access to resources Recommend Favorite

Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry

By Franquet A.   De Laet J.   Schram T.   Terryn H.   Subramanian V.   van Ooij W.J.   Vereecken J.  

Thin Solid Films, Vol. 384, Iss. 1, 2001-03 ,pp. : 37-45

Elsevier

Access to resources Recommend Favorite