UV light induced defects in amorphous silicon thin films

Author: Pivac B.   Pavlovic M.   Kovacevic I.   Etlinger B.   Zulim I.  

Publisher: Elsevier

ISSN: 0042-207X

Source: Vacuum, Vol.71, Iss.1, 2003-05, pp. : 135-139

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Abstract