Towards sub-nanometer scale EELS analysis of polymers in the TEM

Author： Varlot K.   Martin J.M.   Quet C.   Kihn Y.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.68, Iss.2, 1997-06, pp. : 123-133

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