Image deconvolution for defected crystals in field-emission high-resolution electron microscopy

Author： He W.Z.   Li F.H.   Chen H.   Kawasaki K.   Oikawa T.  

Publisher： Elsevier

ISSN： 0304-3991

Source： Ultramicroscopy, Vol.70, Iss.1, 1997-12, pp. : 1-11

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