Residual wave aberrations in the first spherical aberration corrected transmission electron microscope

By Uhlemann S.   Haider M.  

Ultramicroscopy, Vol. 72, Iss. 3, 1998-05 ,pp. : 109-119

Elsevier

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Design of an objective lens pole piece for a transmission electron microscope with a resolution less than 0.1nm at 200kV

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Ultramicroscopy, Vol. 72, Iss. 1, 1998-04 ,pp. : 31-39

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High-resolution imaging with an aberration-corrected transmission electron microscope

By Lentzen M.   Jahnen B.   Jia C.L.   Thust A.   Tillmann K.   Urban K.  

Ultramicroscopy, Vol. 92, Iss. 3, 2002-08 ,pp. : 233-242

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Thickness determination by measuring electron transmission in the TEM at 200kV

By Pozsgai I.  

Ultramicroscopy, Vol. 68, Iss. 1, 1997-05 ,pp. : 69-75

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A 200 kV electron microscope with Schottky field emitter and a helium-cooled superconducting objective lens

By Zemlin F.   Beckmann E.   van der Mast K.D.  

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