International telemicroscopy with a 3MV ultrahigh voltage electron microscope

Author: Takaoka A.   Yoshida K.   Mori H.   Hayashi S.   Young S.J.   Ellisman M.H.  

Publisher: Elsevier

ISSN: 0304-3991

Source: Ultramicroscopy, Vol.83, Iss.1, 2000-05, pp. : 93-101

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Abstract