Test Set Compaction Using Relaxed Subsequence Removal

By Hsiao M.S.  

Journal of Electronic Testing, Vol. 16, Iss. 4, 2000-08 ,pp. : 319-327

Springer Publishing Company

Access to resources Recommend Favorite

Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits

By Hsiao M.S.  

Journal of Electronic Testing, Vol. 16, Iss. 4, 2000-08 ,pp. : 329-338

Springer Publishing Company

Access to resources Recommend Favorite

State and Fault Information for Compaction-Based Test Generation

By Giani A.  

Journal of Electronic Testing, Vol. 18, Iss. 1, 2002-02 ,pp. : 63-72

Springer Publishing Company

Access to resources Recommend Favorite

Static Test Compaction for Scan-Based Designs to Reduce Test Application Time

By Pomeranz I.  

Journal of Electronic Testing, Vol. 16, Iss. 5, 2000-10 ,pp. : 541-552

Springer Publishing Company

Access to resources Recommend Favorite

Modeling of the Electric-Field Dynamics in the Atmosphere Using the Test-Structure Method

By Shatalina M.   Mareev E.   Anisimov S.   Shikhova N.  

Radiophysics and Quantum Electronics, Vol. 48, Iss. 8, 2005-08 ,pp. : 575-586

Springer Publishing Company

Access to resources Recommend Favorite