Author： Greene B.S.
Publisher： Springer Publishing Company
ISSN： 0923-8174
Source： Journal of Electronic Testing, Vol.18, Iss.6, 2002-12, pp. : 613-626
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
A partial scan design unifying structural analysis and testabilities
By Park Sungju
International Journal of Electronics, Vol. 88, Iss. 12, 2001-12 ,pp. :
Multiple Scan Chain Design for Two-Pattern Testing
By Polian I.
Journal of Electronic Testing, Vol. 19, Iss. 1, 2003-02 ,pp. :
Synthesis of Scan Chains for Netlist Descriptions at RT-Level
By Huang Y.
Journal of Electronic Testing, Vol. 18, Iss. 2, 2002-04 ,pp. :