Author: Ocheretnij V.
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.22, Iss.1, 2006-02, pp. : 101-107
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A parallel back-propagation adder structure
International Journal of Electronics, Vol. 85, Iss. 3, 1998-09 ,pp. :
New CMOS circuit implementation of a one-bit full-adder cell
By Shubin V.
Russian Microelectronics, Vol. 40, Iss. 2, 2011-03 ,pp. :