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Springer Publishing Company

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A technique for determining the electric conductivity and mobility of charge carriers in lamellar semiconductor materials

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Effect of oxygen concentration on diffusion length in Czochralski and magnetic Czochralski silicon

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A Microwave Method for Determination of the Recombination Rate of Nonequilibrium Charge Carriers in the Bulk and at the Surface of Doped Silicon Wafers

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Measuring the lifetime of silicon nanocrystal solar cell photo-carriers by using Kelvin probe force microscopy and x-ray photoelectron spectroscopy

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